Bøker
Giuseppe La Rosa
Produkter
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Strong, Alvin W. Sullivan, Timothy D. Rauch, Stewart E. Vollertsen, Rolf-Peter Sune, Jordi La Rosa, Giuseppe Wu, Ernest Y.
9780471731726 IEEE Press Series on Microelectronic Systems Innbundet
04.09.2009
Engelsk
I salg
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