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Reliability Wearout Mechanisms in Advanced CMOS Technologies

Strong, Alvin W. Sullivan, Timothy D. Rauch, Stewart E. Vollertsen, Rolf-Peter Sune, Jordi La Rosa, Giuseppe Wu, Ernest Y.

IEEE Press Series on Microelectronic Systems

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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

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