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Reliability Wearout Mechanisms in Advanced CMOS Technologies

Strong, Alvin W. Sullivan, Timothy D. Rauch, Stewart E. Vollertsen, Rolf-Peter Sune, Jordi La Rosa, Giuseppe Wu, Ernest Y.

IEEE Press Series on Microelectronic Systems

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Innbundet

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Leveringstid: 7-30 dager

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Omtale

This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

  • Utgivelsesdato:

    04.09.2009

  • ISBN/Varenr:

    9780471731726

  • Språk:

    , Engelsk

  • Forlag:

    Wiley-IEEE Press

  • Fagtema:

    Teknologi, ingeniørfag, landbruk og industri

  • Litteraturtype:

    Faglitteratur

  • Sider:

    640

  • Høyde:

    24.3 cm

  • Bredde:

    16.4 cm

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