
Cluster Secondary Ion Mass Spectrometry : Principles and Applications
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Leveringstid: 7-30 dager
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Omtale
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.
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Utgivelsesdato:
28.06.2013
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ISBN/Varenr:
9780470886052
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Språk:
, Engelsk
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Forlag:
John Wiley & Sons Inc
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Fagtema:
Matematikk og naturvitenskap
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Litteraturtype:
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Sider:
368
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Høyde:
16.5 cm
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Bredde:
24.3 cm