Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions

Kumar, Ch Sateesh Singh, M. Muralidhar Krishna, Ram

Heftet

I salg

Leveringstid: 14-30 virkedager

Omtale

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Utgivelsesdato:

29.11.2024
ISBN:

9781032375113
Språk:

, Engelsk
Forlag:
CRC Press
Fagtema:

, Matematikk og naturvitenskap
Litteraturtype:

Sakprosa
Sider:

130
Høyde:

15.6 cm
Bredde:

23.4 cm

Thin-Films for Machining Difficult-to-Cut Materials : Challenges, Applications, and Future Prospects

Kumar, Ch Sateesh Fernandes, Filipe Daniel

Advanced Materials Processing and Manufacturing Heftet 09.10.2024 Engelsk

I salg

Thin-Films for Machining Difficult-to-Cut Materials : Challenges, Applications, and Future Prospects

Kumar, Ch Sateesh Fernandes, Filipe Daniel

Advanced Materials Processing and Manufacturing Innbundet 11.05.2023 Engelsk

I salg