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Elements of Electromigration : Electromigration in 3D IC technology

Tu, King-Ning Liu, Yingxia

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Leveringstid: 7-30 dager

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In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.

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