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Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics: Volume 990 : Symposium Held April 10–12, 2007, San Francisco, California, U.S.A.

Yoon, Do Yeung Wu, Wen-li Lin, Qinghuang Ryan, E. Todd

MRS Proceedings

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Leveringstid: 2-4 uker

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Omtale

This book provides a forum to exchange advances in materials, processes, integration, and reliability in advanced interconnects and packaging. The book also addresses interconnects for emerging technologies, including 3D chip stacking and optical interconnects, as well as interconnects for optoelectronics, plastic electronics and molecular electronics.

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